Product Description

The versatile touchscreen MIC-20 can use either UCI probes or Leeb (rebound) impact devices. This makes the MIC 20 a universal instrument: You can use it to test fine-grained materials having different masses and shapes, HAZ, or heat treated surfaces using the UCI method, or test large, coarse-grained components, forgings, and cast materials using the rebound method. Base instrument package Includes: MIC 20 Instrument with Colour TFT display, AC Power Supply / NiMH Pack Charger NiMH Rechargeable Battery Pack Carrying Case Operating Manual Certificate of Conformity Made in Germany. Contact us today for an on-site demo