X-Ray Fluorescence measurement system for Elemental Analysis.
With the growing demand for composition analysis, Bruker’s XMS – X-Ray Fluorescence (XRF) measurement system emerges a compact and rugged solution that’s specifically designed for industrial applications. This versatile system is designed to withstand extreme conditions, including shocks, vibrations, humidity, and dust, making it reliable in even the most challenging environments. The XMS is engineered for fast data collection and analysis to deliver high-quality results that’ll meet your application requirements and increase operational efficiency.
Applications:
- Automated Core Logging
- In-Line Coating & Layer Analysis
- In-Line Glass Production & Recycling
- In-line Alloy Identification
